发明名称 ADHESION IMPROVEMENT OF DIELECTRIC BARRIER TO COPPER BY THE ADDITION OF THIN INTERFACE LAYER
摘要 <p>Embodiments described herein provide a method of processing a substrate. The method includes depositing an interface adhesion layer between a conductive material and a dielectric material such that the interface adhesion layer provides increased adhesion between the conductive material and the dielectric material. In one embodiment a method for processing a substrate is provided. The method comprises depositing an interface adhesion layer on a substrate comprising a conductive material, exposing the interface adhesion layer to a nitrogen containing plasma, and depositing a dielectric layer on the interface adhesion layer after exposing the interface adhesion layer to the nitrogen containing plasma.</p>
申请公布号 WO2009055450(A1) 申请公布日期 2009.04.30
申请号 WO2008US80760 申请日期 2008.10.22
申请人 APPLIED MATERIALS, INC.;LEE, YONG-WON;LEE, SANG M.;SHEK, MEIYEE;YE, WEIFENG;XIA, LI-QUN;WITTY, DEREK R.;NOWAK, THOMAS;ROCHA-ALVAREZ, JUAN CARLOS;LI, JIGANG 发明人 LEE, YONG-WON;LEE, SANG M.;SHEK, MEIYEE;YE, WEIFENG;XIA, LI-QUN;WITTY, DEREK R.;NOWAK, THOMAS;ROCHA-ALVAREZ, JUAN CARLOS;LI, JIGANG
分类号 H01L23/48 主分类号 H01L23/48
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