发明名称 IMMERSION PHOTOLITHOGRAPHY SYSTEM AND METHOD USING INVERTED WAFER PROJECTION OPTICAL SYSTEM INTERFACE
摘要 <P>PROBLEM TO BE SOLVED: To provide a simple system and a method for confining liquid between a projection optical system and a wafer in a liquid immersion photolithography system. <P>SOLUTION: The liquid immersion photolithography system includes an exposure system that exposes a substrate 101 with electromagnetic radiation, and also includes a projection optical system 100 that focuses the electromagnetic radiation on the substrate, and a liquid supply system for providing liquid between the projection optical system 100 and the substrate 101, and the projection optical system is positioned below the substrate. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009094528(A) 申请公布日期 2009.04.30
申请号 JP20080297046 申请日期 2008.11.20
申请人 ASML HOLDING NV 发明人 SEWELL HARRY
分类号 G02B13/14;H01L21/027;G03B27/42;G03F7/20 主分类号 G02B13/14
代理机构 代理人
主权项
地址