| 摘要 |
PROBLEM TO BE SOLVED: To provide a device inspection system capable of reducing inspection cost and shortening inspection time. SOLUTION: In the device inspection system 60, an inspection signal is generated in an inspection signal generator 10, and is input in a tuner device 25, and then an output signal of the tuner device 25 is input in a demodulation device 35 as an inspection signal. Then, inspections of the tuner device 25 and the demodulation device 35 in block by inspecting the output signal of the demodulation device 35 by an output signal inspection device 50. Thus, since a device for inspection is communalized between the tuner device 25 and the demodulation device 35, the inspection costs are reduced. In addition, since the tuner device 25 and the demodulation device 35 are inspected in block, the inspection time is shortened. COPYRIGHT: (C)2009,JPO&INPIT
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