APPARATUS, METHOD AND PROGRAM FOR ANALYZING MICROSTRIP LINE

摘要

PROBLEM TO BE SOLVED: To provide an apparatus, a method and a program for analyzing a microstrip line which analyze the characteristic impedance of a microstrip line at high speed with less computer resources, and calculating the cross-sectional size required to achieve a predetermined characteristic impedance. SOLUTION: The apparatus for analyzing a microstrip line 1 includes a base 11 with a dielectric constantεsuband a thickness (h), a surface wiring 13 with a width (w) and a thickness (t), and a surface dielectric 10 with a dielectric constantεsrand a thickness T. The apparatus for analyzing the microstrip line 1 has at least either a first computing means for calculating the effective dielectric constantεeffof the microstrip line 1 using a predetermined relational expression or a second computing means for calculating an undecided structural parameter among structure parameters with a dielectric constantεsub, a thickness (h), a width (w), a thickness (t), a dielectric constantεsr, and a thickness T. COPYRIGHT: (C)2009,JPO&INPIT