| 摘要 |
<p>The invention relates to a process and an equipment used for conoscopic measurements, in thin optical anisotropic layers, located on an opaque or transparent sublayer, as well as for conoscopic measurements of improved performance in thick media. According to the invention, the process uses the reflexion of the light beam at the interface of the thin layer subjected to measurement, with the sublayer it is located on. According to the invention, the equipment mainly consists of a light source (1) emitting a beam (2) whose diameter may be varied by a telescopic lens system (12), a beam divider (3), an optical polarizer (4) which also has the role of analyzer (2) of the beam reflected by the thin layer (13) subjected to conoscopic measurement, from a support (6) which comprises the assembly (5) consisting of the thin layer (13) subjected to measurement and the sublayer (14) on which it is placed, support (6) which allows the adjustment of the temperature for the thin layer (13), allows the application of a mechanical tension upon the thin layer (13), depending on necessities, allows the application of an electric and/or magnetic field to the thin layer (13), as well as the rotation of the thin layer (13).</p> |
