发明名称 SPECTROMETER FOR ANALYSIS OF MULTIPLE SAMPLES
摘要 A spectrometer (100) includes a light source (102) providing output light (106) to the bundled input ends (108) of multiple light pipes (110). The light pipes (110) branch into sets (118) between their input ends (108) and output ends (114), with each set (118) illuminating a sample detector (126) (via a sample chamber (122)) for measuring light scattered or emitted by a sample, or a reference detector (128) for obtaining a reference/datum measurement of the supplied light, so that comparison of measurements from the sample detector (126) and the reference detector (128) allows compensation of the sample detector measurements for drift. Efficient and accurate measurement is further assured by arraying the multiple light pipes (110) in each set (118) about the input bundle (116) so that each set receives at least substantially the same amount of light from the light source (102).
申请公布号 WO2007047240(A3) 申请公布日期 2009.04.30
申请号 WO2006US39488 申请日期 2006.10.10
申请人 THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC;EBERSOLE, MATTHEW, D.;IVERSON, JOHN, R. 发明人 EBERSOLE, MATTHEW, D.;IVERSON, JOHN, R.
分类号 G01J3/30;G01J3/42;G03H1/02 主分类号 G01J3/30
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