发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE |
摘要 |
A manufacturing method of a semiconductor substrate is provided to reduce a metal pollution of an SOI(Silicon On Insulator) film by sintering the SOI substrate with temperature of 600~1250°C. A surface of a monocrystalline silicon substrate(10) is activated by a plasma process. The monocrystalline silicon substrate and a quartz substrate(20) are bonded in a low temperature. An SOI substrate which is a semiconductor substrate having an SOI film(12) is prepared. The SOI substrate is sintered. A metal impurity mixed in the SOI film and an interface of the SOI film and the quartz substrate is gettered on a surface region of the silicon film. A semiconductor substrate having a final SOI film(13) is obtained by removing a gettering layer of the silicon film of the SOI substrate.
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申请公布号 |
KR20090042138(A) |
申请公布日期 |
2009.04.29 |
申请号 |
KR20080073997 |
申请日期 |
2008.07.29 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
AKIYAMA SHOJI;KUBOTA YOSHIHIRO;ITO ATSUO;KAWAI MAKOTO;TOBISAKA YUUJI;TANAKA KOICHI |
分类号 |
H01L21/20;H01L21/265;H01L21/324 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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