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发明名称
Probe card for wafer examination
摘要
申请公布号
KR20090003953(U)
申请公布日期
2009.04.29
申请号
KR20070017222U
申请日期
2007.10.24
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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