发明名称 Evaluating the surface structure of construction elements using various presentation angles
摘要 <p>The method involves scanning an electronic component (110) by a relative movement (122) between the electronic component and an illumination light (102), and illuminating the electronic component under an angle. The electronic component is newly scanned by a new relative movement between the electronic component and the illumination light. The electronic component is illuminated under another angle that is different from the former angle. A measuring light (107) is newly held, where the measuring light is scattered-back by the electronic component partially on a light detector (106). Independent claims are also included for the following: (1) a device for optically evaluating a three-dimensional surface structure of electronic component (2) an assembly machine for assembling printed circuit boards with electronic components (3) a computer readable medium with a program for optically evaluating a three-dimensional surface structure of an electronic component.</p>
申请公布号 EP2053913(A2) 申请公布日期 2009.04.29
申请号 EP20080103815 申请日期 2008.05.05
申请人 SIEMENS ELECTRONICS ASSEMBLY SYSTEMS GMBH & CO. KG 发明人 BESCH, KARL-HEINZ;HEDRICH, MATTHIAS;NEUMAIER, KLAUS;SCHNEKENBURGER, THOMAS
分类号 H05K13/00;G01N21/95;H05K13/04;H05K13/08 主分类号 H05K13/00
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