发明名称 Testing and inspecting method of a plasma display panel
摘要 An improved method of testing and inspecting a plasma display panel. In a plasma display panel, a plurality of cells are formed at an intersection of each electrode disposed in a row direction and in a column direction of the panel. A field is formed of a plurality of sub-fields, and the combination of the sub-fields enables the panel to have a gradation display. In the inspection method, an address pulse voltage is not applied to a target cell to be inspected in a predetermined sub-field, but is applied to at least one cell of the cells adjacent to the target cell, and the address pulse voltage is applied to the target cell in the successive sub-field. If the barrier ribs of the target cell have an imperfection, wall charges of the cell are affected by the discharge occurred in an adjacent cell, and the target cell fails to light on in the successive sub-field. The inspection method can thus detect lighting failure caused by defective barrier ribs.
申请公布号 US7525512(B2) 申请公布日期 2009.04.28
申请号 US20050542612 申请日期 2005.07.18
申请人 PANASONIC CORPORATION 发明人 IKURA TSUNEO;WAKITANI TAKAO
分类号 G09G3/28;H01J9/42;H01J11/02;H01J11/20;H01J11/44;H01J17/49 主分类号 G09G3/28
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