发明名称 High voltage double diffused drain MOS transistor with medium operation voltage
摘要 A method of fabricating a high voltage MOS transistor with a medium operation voltage on a semiconductor wafer. The transistor has a double diffused drain (DDD) and a medium operation voltage such as 6 to 10 volts, which is advantageous for applications having both low and higher operation transistor devices. The second diffusion region of the DDD is self-aligned to the spacer on the sidewalls of the gate and gate dielectric, so that the transistor size may be decreased.
申请公布号 US7525150(B2) 申请公布日期 2009.04.28
申请号 US20040819527 申请日期 2004.04.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN FU-HSIN;LIN YI-CHUN;LIU RUEY-HSIN
分类号 H01L29/78;H01L21/331;H01L21/336;H01L21/8222;H01L21/8234;H01L29/06;H01L29/08 主分类号 H01L29/78
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