发明名称 |
Method for monitoring temperature in thermal process |
摘要 |
A method for monitoring a temperature in a thermal process is described. A monitor substrate is provided and subject to ion implantation, and a characteristic parameter of the monitor substrate correlated to the disorder degree of the lattice structure of the same is measured to obtain a first value. The monitor substrate is then subject to the thermal process, and the characteristic parameter of the monitor substrate is measured again to obtain a second value. The difference between the first value and the second value is calculated to derive the temperature in the thermal process.
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申请公布号 |
US7524682(B2) |
申请公布日期 |
2009.04.28 |
申请号 |
US20060309060 |
申请日期 |
2006.06.15 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
WENG CHEN-LIANG |
分类号 |
H01L21/66;H01L21/336;H01L21/44 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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