发明名称 System and method for automated detection of singular faults in common diodes power bus circuits
摘要 A system automatically detects singular faults in diode or'd power bus circuit (12) comprised of a plurality of diodes (PD1-PDN). The system includes a diode test circuit (14, 16) that selectively applies a voltage pulse to one of the plurality of diodes and detects the presence of singular faults based on the monitored response to the voltage pulse.
申请公布号 EP2051089(A2) 申请公布日期 2009.04.22
申请号 EP20080251378 申请日期 2008.04.09
申请人 HAMILTON SUNDSTRAND CORPORATION 发明人 AVRITCH, STEVEN A.;HESS, GARY L.
分类号 G01R31/40;G01R31/02 主分类号 G01R31/40
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