发明名称 |
System and method for automated detection of singular faults in common diodes power bus circuits |
摘要 |
A system automatically detects singular faults in diode or'd power bus circuit (12) comprised of a plurality of diodes (PD1-PDN). The system includes a diode test circuit (14, 16) that selectively applies a voltage pulse to one of the plurality of diodes and detects the presence of singular faults based on the monitored response to the voltage pulse.
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申请公布号 |
EP2051089(A2) |
申请公布日期 |
2009.04.22 |
申请号 |
EP20080251378 |
申请日期 |
2008.04.09 |
申请人 |
HAMILTON SUNDSTRAND CORPORATION |
发明人 |
AVRITCH, STEVEN A.;HESS, GARY L. |
分类号 |
G01R31/40;G01R31/02 |
主分类号 |
G01R31/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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