发明名称 Semiconductor processing method for forming electrical contacts, and semiconductor structure
摘要 Electroless plating can be utilized to form electrical interconnects (130,132) associated with semiconductor substrates. A semiconductor substrate can be formed to have a spacer structure (102) thereover with a surface suitable for electroless plating, and to also have a digit line (54) thereover having about the same height as the spacer structure. A layer can be formed over the spacer structure and digit line, and openings (120,122) can be formed through the layer to the upper surfaces of the spacer structure and digit line. Subsequently, a conductive material can be electroless plated within the openings to form electrical contacts within the openings. The opening extending to the spacer structure can pass through a capacitor electrode (62), and accordingly the conductive material formed within such opening can be utilized to form electrical contact to the capacitor electrode.
申请公布号 EP2051295(A2) 申请公布日期 2009.04.22
申请号 EP20090001151 申请日期 2005.03.23
申请人 MICRON TECHNOLOGY, INC. 发明人 SINHA, NISHANT;CHOPRA, DINESH;FISHBURN, FRED D.
分类号 H01L21/288;H01L21/768 主分类号 H01L21/288
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