发明名称 Semiconductor device having first and second dummy wirings varying in sizes/coverage ratios around a plug connecting part
摘要 A semiconductor device, has a semiconductor substrate; a first insulating film which is disposed above the semiconductor substrate; a second insulating film which is disposed above the first insulating film; a wiring which is disposed in the first insulating film and has a plug connecting part; a plug which is disposed in the second insulating film and connected to the plug connecting part; a plurality of first dummy wirings which are disposed in a first area near the plug connecting part in the first insulating film; and a plurality of second dummy wirings which are disposed in a second area near the wiring excepting the plug connecting part in the first insulating film, and have at least either a width smaller than that of the first dummy wirings or a pattern coverage ratio larger than that of the first dummy wirings.
申请公布号 US7521803(B2) 申请公布日期 2009.04.21
申请号 US20060583698 申请日期 2006.10.20
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MORITA TOSHIYUKI;NISHIOKA TAKESHI
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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