发明名称 |
Semiconductor device, method for manufacturing the same, and gate electrode structure |
摘要 |
A semiconductor structure includes (a) a semiconductor substrate having a channel region and a first integrated impurity diffusion region including a first electric field reduction region that is formed adjacent to the channel region and which includes a plurality of specific regions separated from each other, (b) a first insulating film formed on the semiconductor substrate, and (c) a first electrode structure having a first region formed above the channel region and a second region that is formed adjacent to the first region and above the first electric field reduction region to be self-aligned with the first electric field reduction region, the semiconductor structure including one or more openings formed above the plurality of specific regions and a first opening surrounding portion surrounding the one or more openings.
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申请公布号 |
US7521759(B2) |
申请公布日期 |
2009.04.21 |
申请号 |
US20060276824 |
申请日期 |
2006.03.15 |
申请人 |
OKI SEMICONDUCTOR CO., LTD. |
发明人 |
SASAKI KATSUHITO |
分类号 |
H01L29/94 |
主分类号 |
H01L29/94 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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