| 摘要 |
A local input/output line test circuit and a method thereof is provided to reduce a test fail by supplying different voltages to a local input/ out line which are adjacent to each other in response to a test mode signal. In wafer burn in test, a test controller outputs a test signal for supplying a stress by supplying the voltage of the different electric potential in response to the test mode signal for testing the local input output line between the adjacent local input output lines. The test controller outputs a first test signal for testing the first group local input output line in response to the first test mode signal. The test signal generator(10) outputs a second test signal for testing the second group local input output line in response to the second test mode signal. The enable signal generation unit(20) produces the first test mode signal or the enable signal activated in the second test mode signal activation. |
