METHOD FOR USING AN ATOMIC FORCE MICROSCOPE

摘要

The invention relates to a method for using an atomic force microscope. The method consists of: exciting lower and upper natural vibration modes of a microlever (M) disposed on a sample; and analysing the variation in a variable of a first output signal (A i cos(É i t-&phis; i )) representative of the response of the microlever (M) to excitation of the lower mode with respect to the variation in a parameter influenced by a variable of a second output signal (A j cos(É j t-&phis; j )) representative of the response of the microlever (M) to the excitation of the upper mode, and/or analysing the variation in a variable of a second output signal (A j cos(É j t-&phis; j )) representative of the response of the microlever (M) to the excitation of the upper mode with respect to the variation in a parameter influenced by a variable in a first output signal (A j cos(É i t-&phis; i )) representative of the response of the microlever (M) to the excitation of the lower mode