发明名称 |
Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer product |
摘要 |
A test circuit tester includes a scan-chain input-output information generator that generates information for an input and an output of the scan chain that is scan-chain input-output information, based on input information for the scan chain; a test-circuit input-output information generator that generates information for an input and an output of the test circuit that is test-circuit input-output information, based on the scan-chain input-output information; an output unit that outputs the test-circuit input-output information generated; and a verifying unit that verifies the test circuit based on an output pattern output from the test circuit through the scan chains in response to input of the information for the input of the test circuit output to the test circuit, and the information for the output from the test circuit.
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申请公布号 |
US7516376(B2) |
申请公布日期 |
2009.04.07 |
申请号 |
US20040968140 |
申请日期 |
2004.10.20 |
申请人 |
FUJITSU MICROELECTRONICS LIMITED |
发明人 |
OKANO OSAMU;KONISHI HIDEAKI |
分类号 |
G01R31/28;G01R31/3181;G01R31/3185 |
主分类号 |
G01R31/28 |
代理机构 |
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