发明名称 |
Method of and system for functionally testing multiple devices in parallel in a burn-in-environment |
摘要 |
A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.
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申请公布号 |
US7514947(B2) |
申请公布日期 |
2009.04.07 |
申请号 |
US20070848282 |
申请日期 |
2007.08.31 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ALBERT JASON T.;BRONK WILLIAM T.;EBY TIMOTHY J.;HAMILTON MICHAEL J.;JAMES NORMAN K. |
分类号 |
G01R31/02;G01R31/26 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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