发明名称 INSPECTION DEVICE FOR TRIAL TEST INCLUDING PROGRAM USING DUAL PROCESS
摘要 An inspection device for a trial test including a program using a dual process are provided to divide software configuration for a trial test into a controller program and an image unit program and include the controller program and the image unit program in additional processors, thereby effectively maintaining a program. A CPU board performs an operation process. A memory unit stores a program using a dual processor. A dummy load assembly provides a load used for a trial test. A wire apparatus assembly provides a wire to an inspection device and performs communication with an external apparatus. A trial board performs a trial test by receiving a signal from a trial target device. A VME bus transmits data between respective configuration elements. A program stored in a memory unit includes an image processing unit(100), a controller(200) and a sharing memory(300). An image processor provides a GUI(Graphic User Interface) to a user. A controller controls hardware and processes and controls a signal received from the trial target device. The sharing memory exchanges and stores a signal between the image processor and the controller. The image processor and the controller are processed in additional processors(10-1.10-2).
申请公布号 KR20090033507(A) 申请公布日期 2009.04.06
申请号 KR20070098544 申请日期 2007.10.01
申请人 DOOSAN INFRACORE CO., LTD. 发明人 SUH, HO SIK
分类号 G06F9/455;G01R31/00;G06F11/22 主分类号 G06F9/455
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