发明名称 A NANO IMPRINT TECHNIQUE WITH INCREASED FLEXIBILITY WITH RESPECT TO ALIGNMENT AND FEATURE SHAPING
摘要 By forming metallization structures on the basis of an imprint technique, in which via openings and trenches may be commonly formed, a significant reduction of process complexity may be achieved due to the omission of at least one further alignment process as required in conventional process techniques. Furthermore, the flexibility and efficiency of imprint lithography may be increased by providing appropriately designed imprint molds in order to provide via openings and trenches exhibiting an increased fill capability, thereby also improving the performance of the finally obtained metallization structures with respect to reliability, resistance against electromigration and the like.
申请公布号 KR20090033464(A) 申请公布日期 2009.04.03
申请号 KR20097002089 申请日期 2007.04.05
申请人 ADVANCED MICRO DEVICES, INC. 发明人 SEIDEL ROBERT;PETERS CARSTEN;FEUSTEL FRANK
分类号 H01L21/768 主分类号 H01L21/768
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