发明名称 SCATTERING PARTICLE REMOVING DEVICE, SCATTERING PARTICLE REDUCING METHOD, LIGHT SOURCE APPARATUS, LIGHTING OPTICAL DEVICE, EXPOSURE DEVICE AND MANUFACTURING METHOD OF ELECTRONIC DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To prevent the deterioration of the optical performance of an optical system by efficiently removing scattering particles. <P>SOLUTION: This scattering particle removing device removing scattering particles generated by plasma generation is provided with an electrode plate arranged in an optical path of EUV light radiated from plasma and a voltage applying part which is installed outside the optical path of EUV light and applies a positive voltage or a negative voltage to the electrode plate. The electrode plate is disposed to cross the optical path of EUV light. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009070982(A) 申请公布日期 2009.04.02
申请号 JP20070236897 申请日期 2007.09.12
申请人 NIKON CORP 发明人 AOKI TAKASHI
分类号 H01L21/027 主分类号 H01L21/027
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