| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which has a pad of which the logic level is fixed by the impression of electric potential from an external terminal, and which enables efficient inspection of a state of connection by bonding between the external terminal and the pad. SOLUTION: A test circuit of the semiconductor integrated circuit has, for each of the pads in a plurality, a control terminal which accepts a control signal of a logic level equal to the logic level of an impression signal of the external terminal corresponding thereto, an inverter which inverts the logic level of the control terminal and has an inverted output end connected to a connection line of the pad, and an exclusive NOR gate which is connected discretely to the connection line and the control terminal and generates an exclusive NOR output of the logic level of the connection line and that of the control terminal. The exclusive NOR output shows goodness/badness of the state of connection between the pad and the external terminal corresponding thereto. COPYRIGHT: (C)2009,JPO&INPIT
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