发明名称 PLASMA OXIDATION TREATMENT METHOD, AND METHOD OF FORMING SILICON OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To form silicon oxide films with different thicknesses on a p-type diffusion region and an n-type diffusion region formed on the same silicon layer without need of a complicated process. SOLUTION: Plasma of a treatment gas containing oxygen and Ar oxidizes the p-type diffusion region 103 and the n-type diffusion region 105 at different oxidation rates. A thick film part 107a with a thickness of T1 is formed on the surface of the p-type diffusion region 103, and a thin film part 107b with a thickness of T2 thinner than the thick film part 107a is formed on the surface of the n-type diffusion region 105. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009070919(A) 申请公布日期 2009.04.02
申请号 JP20070235733 申请日期 2007.09.11
申请人 TOKYO ELECTRON LTD 发明人 UEDA HIROICHI;NAKANISHI TOSHIO;HIROTA YOSHIHIRO;KITAGAWA JUNICHI
分类号 H01L21/316;H01L21/8238;H01L27/092;H01L29/78 主分类号 H01L21/316
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