发明名称 |
PLASMA OXIDATION TREATMENT METHOD, AND METHOD OF FORMING SILICON OXIDE FILM |
摘要 |
PROBLEM TO BE SOLVED: To form silicon oxide films with different thicknesses on a p-type diffusion region and an n-type diffusion region formed on the same silicon layer without need of a complicated process. SOLUTION: Plasma of a treatment gas containing oxygen and Ar oxidizes the p-type diffusion region 103 and the n-type diffusion region 105 at different oxidation rates. A thick film part 107a with a thickness of T1 is formed on the surface of the p-type diffusion region 103, and a thin film part 107b with a thickness of T2 thinner than the thick film part 107a is formed on the surface of the n-type diffusion region 105. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009070919(A) |
申请公布日期 |
2009.04.02 |
申请号 |
JP20070235733 |
申请日期 |
2007.09.11 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
UEDA HIROICHI;NAKANISHI TOSHIO;HIROTA YOSHIHIRO;KITAGAWA JUNICHI |
分类号 |
H01L21/316;H01L21/8238;H01L27/092;H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
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地址 |
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