发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that can suppress new problems of STI. SOLUTION: The method of manufacturing the semiconductor device includes the steps of: (a) forming a mask layer having an opening in a plane shape including an element isolation region above an Si substrate; (b) forming a sidewall spacer of a material which can be selectively removed for a mask layer on an opening sidewall of the mask layer; (c) forming a trench by etching the Si substrate using the sidewall spacer as a mask; (d) forming the element isolation region burying the trench; (e) selectively removing the sidewall spacer; (f) ion-injecting nitrogen from above the Si substrate; (g) removing the mask layer; and (h) forming a semiconductor element in an active region defined by the insulating element isolation region. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009070949(A) 申请公布日期 2009.04.02
申请号 JP20070236267 申请日期 2007.09.12
申请人 FUJITSU MICROELECTRONICS LTD 发明人 NISHIGAYA KEITA
分类号 H01L29/78;H01L21/76;H01L21/8234;H01L27/08;H01L27/088 主分类号 H01L29/78
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