发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that can suppress new problems of STI. SOLUTION: The method of manufacturing the semiconductor device includes the steps of: (a) forming a mask layer having an opening in a plane shape including an element isolation region above an Si substrate; (b) forming a sidewall spacer of a material which can be selectively removed for a mask layer on an opening sidewall of the mask layer; (c) forming a trench by etching the Si substrate using the sidewall spacer as a mask; (d) forming the element isolation region burying the trench; (e) selectively removing the sidewall spacer; (f) ion-injecting nitrogen from above the Si substrate; (g) removing the mask layer; and (h) forming a semiconductor element in an active region defined by the insulating element isolation region. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009070949(A) |
申请公布日期 |
2009.04.02 |
申请号 |
JP20070236267 |
申请日期 |
2007.09.12 |
申请人 |
FUJITSU MICROELECTRONICS LTD |
发明人 |
NISHIGAYA KEITA |
分类号 |
H01L29/78;H01L21/76;H01L21/8234;H01L27/08;H01L27/088 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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