| 摘要 |
Autonomous or machine generation of test specifications can be achieved by capturing the measured test data of a device and then using the captured test data to build a test specification, such as a limit line, for subsequent testing of similar devices. The generated test specification is typically adapted for use with respect to limited resources, such as through use of a piece-wise linear configuration. In an embodiment, the number of piece-wise linear portions of the generated test specification is minimized or otherwise optimized. In embodiments, the generated test specification is adjusted to accommodate expected measurement variation, such as thermal noise, device process variation, random jitter, etc., and, if desired, adjusted to allow for changes in test accuracy of subsequent tests. In one embodiment, one or more test measurement inaccuracies are eliminated in the construction of the limit line.
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