Memory Sense Scan Circuit And Test Interface

摘要

Embodiments of a scannable IO circuit featuring reduced latch count for pipelined memory architectures and test methodology are described. For a pipelined memory system performing at speed tests, the timing sequence for processing a test command comprises a precharge-read-precharge-write sequence for each clock cycle starting with the rising clock edge. The memory circuit utilizing this test command timing sequence comprises a sense amplifier and a single latch. The sense amplifier itself is used as a latch to implements scan functionality for the memory circuit. The memory device is incorporated into an integrated test wrapper circuit that executes back-to-back commands through serial compare operations using integrated scan flip-flop circuits. The test wrapper includes a fanout block and padded address scheme for testing multiple and disparate size memory devices in parallel.