发明名称 |
HEAD SOCKET FOR CONTACTING PROBE CARD AND WAFER TEST APPARATUS |
摘要 |
Provided are a head socket for contacting a probe card and a wafer test apparatus, in which the probe card and the head socket are simply connected to each other and damage of a connector or the head socket that may occur when the probe card and the head socket are connected to each other, is prevented from occurring in advance. |
申请公布号 |
WO2009017314(A3) |
申请公布日期 |
2009.04.02 |
申请号 |
WO2008KR04194 |
申请日期 |
2008.07.17 |
申请人 |
LEE, CHANG-HAK;KIM, SUNG-CHUL |
发明人 |
LEE, CHANG-HAK;KIM, SUNG-CHUL |
分类号 |
H01L23/32 |
主分类号 |
H01L23/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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