发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a microcrystalline semiconductor film with favorable quality over a large-area substrate. SOLUTION: After forming a gate insulating film over a gate electrode, in order to improve quality of a microcrystalline semiconductor film formed in an initial stage, glow discharge plasma is generated by supplying high-frequency powers with different frequencies, and a lower part of the film near a gate insulating film interface is formed under a first film formation condition, which is low in film formation rate but results in a good quality film. Thereafter, an upper part of the film is deposited under a second film formation condition with higher film formation rate, and further, a buffer layer is stacked on the microcrystalline semiconductor film. High-frequency powers having different frequencies (different wavelength) are superimposed and applied to the electrode of a plasma CVD apparatus, so that densification and uniformity of plasma for preventing the effect of surface standing wave of plasma can be achieved. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009071291(A) 申请公布日期 2009.04.02
申请号 JP20080204717 申请日期 2008.08.07
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TEZUKA SUKEAKI;CHOKAI SATOSHI;FURUNO MAKOTO;JINBO YASUHIRO;ORIKI KOJI;KUWABARA HIDEAKI
分类号 H01L21/336;C23C16/24;C23C16/505;H01L29/786 主分类号 H01L21/336
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