发明名称 DEFECT DETECTING APPARATUS AND METHOD
摘要 A front side surface of a cover glass of a solid state imaging device is focused, and a front side image is captured. Next, a rear side surface of the cover glass is focused, and a rear side image is captured. The front side image and the rear side image are combined with each other to create a composite image. A first threshold value is set for each pixel in the composite image by dynamic thresholding. An image composed of pixels whose gray values exceed the first threshold value is identified as a defect candidate image. The maximum gray value of the defect candidate image is multiplied by a constant rate to set a second threshold value. An image composed of pixels whose gray value is less than the second threshold value is eliminated as a blurred image from the defect candidate image. Thereby, only a spot defect image, an allowable defect image, and a stain defect image remain in the composite image.
申请公布号 US2009087079(A1) 申请公布日期 2009.04.02
申请号 US20080234667 申请日期 2008.09.21
申请人 FUJIFILM CORPORATION 发明人 ONODA YUJI
分类号 G06K9/62 主分类号 G06K9/62
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