发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING
摘要 A method for manufacturing a semiconductor device includes providing a semiconductor substrate including a first surface and a second surface which is arranged opposite to the first surface. The semiconductor substrate includes a plurality of trench structures extending from the first surface into the semiconductor substrate. The thickness of the semiconductor substrate is then reduced by removing semiconductor material at the second surface to obtain a processed second surface with exposed bottom portions of the trench structures. At least a first mask is formed on the processed second surface in a self-aligned manner with respect to the bottom portions of the trench structures, and doping regions are formed in the semiconductor substrate between the trench structures.
申请公布号 US2009085104(A1) 申请公布日期 2009.04.02
申请号 US20070866151 申请日期 2007.10.02
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 WEBER HANS MARTIN
分类号 H01L29/78;H01L21/265;H01L21/336 主分类号 H01L29/78
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