Method and device for measuring for simulating processes in a microscope system

摘要

The method involves providing a camera (12) attached to a microscope (14) for taking microscopic images. A highly dissolved complete microscopic image of a sample (13) is obtained by a microscope system (10). One of the microscopic images is simulated in a computer (40) based on the highly dissolved complete microscopic image of the sample and dependent on parameter alignment of the microscope and/or the camera, where the former microscopic image is viewed by the camera during a real analysis of the sample with the microscope system. Independent claims are also included for the following: (1) a device for simulating a process in a microscope system (2) a computer program with program code for simulating of process in the microscope system (3) a computer program product with program code for simulating of process in the microscope system.