发明名称 Resist composition and pattern-forming method using the same
摘要 <p>A resist composition includes (A) a resin including: a repeating unit capable of decomposing by the action of an acid to increase solubility in an alkali developing solution and represented by formula (I), and a repeating unit represented by formula (II); and (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation: wherein A represents a hydrogen atom, an alkyl group, a hydroxyl group, an alkoxyl group, a halogen atom, a cyano group, a nitro group, an acyl group, an acyloxy group, a cycloalkyl group, an aryl group, a carboxyl group, an alkyloxycarbonyl group, an alkylcarbonyloxy group, or an aralkyl group; Ra represents a group containing a group capable of decomposing by the action of an acid; Rb represents an alkylene group, a cycloalkylene group, or a group of combining these groups; Y represents a heterocyclic group; and m represents 0 or 1.</p>
申请公布号 EP2042925(A2) 申请公布日期 2009.04.01
申请号 EP20080016851 申请日期 2008.09.25
申请人 FUJIFILM CORPORATION 发明人 HIRANO, SHUJI;MIZUTANI, KAZUYOSHI;SUGIYAMA, SHINICHI;YOKOYAMA, JIRO
分类号 G03F7/039 主分类号 G03F7/039
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