| 摘要 |
A probe, a method for manufacturing the same and a method of coupling the same are provided to adjust a relative location of a contact tip and compensate for twist deformation, thereby improving contact reliability between a probe and a contact pad. A probe(10) comprises a body(11), a pair of beam units and a pair of contact tips(14). The body is twisted at a deformation boundary line. The beam units are integrally formed respectively on ends of the body and extended downward. At least a part of the beam unit has flexibility. The pair of contact tips are integrally formed in one ends of the beam units. The probe has a board shape. |
