A METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS

摘要

A bright-field photographing method using X-ray is provided to inspect structural nonuniformity and lattice defect in a sample precisely within a short time. A bright-field photographing method using X-ray comprises a step of arranging a sample on a holder in the Laue transmission geometry and setting the sample to make single reflection on the Bragg diffraction, a step of irradiating monochrome X-ray beam onto the sample, and a step of obtaining a penetrating radiation imaging image and an inverted diffraction image of the monochromatic X-ray beam.