发明名称 Methods and apparatus for a stepped-drift MOSFET
摘要 A power metal-oxide-semiconductor field effect transistor (MOSFET)(100) incorporates a stepped drift region including a shallow trench insulator (STI)(112) partially overlapped by the gate (114) and which extends a portion of the distance to a drain region (122). A silicide block extends from and partially overlaps STI (112) and drain region (122). The STI (112) has a width that is approximately 50% to 75% of the drift region.
申请公布号 US7511319(B2) 申请公布日期 2009.03.31
申请号 US20060361624 申请日期 2006.02.24
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 ZHU RONGHUA;BOSE AMITAVA;KHEMKA VISHNU K.;ROGGENBAUER TODD C.
分类号 H01L21/76 主分类号 H01L21/76
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