发明名称 Semiconductor device and test system which output fuse cut information sequentially
摘要 A semiconductor device includes a plurality of fuses, and a plurality of latch circuits respectively electrically connected to the plurality of fuses. The plurality of latch circuits are configured to store respective fuse-cut information from the plurality of fuses, and to then sequentially transmit the fuse-cut information through the latch circuits to output sequential data indicative of a fuse-cut state of the plurality of fuses.
申请公布号 US7511509(B2) 申请公布日期 2009.03.31
申请号 US20060605224 申请日期 2006.11.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE YOU-SANG;LEE JIN-YUB
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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