发明名称 |
Semiconductor memory device, test system including the same and repair method of semiconductor memory device |
摘要 |
A semiconductor memory device includes an array having memory cells arranged in rows and columns; a clock-to-address converter for counting an external clock signal to generate an address for accessing the array based on the counted value, during a test operation mode; and a redundancy circuit for storing the address generated by the clock-to-address converter.
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申请公布号 |
US7512001(B2) |
申请公布日期 |
2009.03.31 |
申请号 |
US20060556374 |
申请日期 |
2006.11.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON SOONG-SUNG;KIM SANG-BUM;KANG SANG-WOOK;SOHN KEON-HAN |
分类号 |
G11C16/06 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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