| 摘要 |
A spectrophotometer, in which an emission spectrum of the light source is measured. Based on the measured emission spectrum, a threshold is set to allow only an outstanding spectral intensity in a specific wavelength region to be greater than the threshold. Then, a ratio between the setup threshold and a peak spectral intensity in the specific wavelength region greater than the threshold is calculated. Then, an electric-charge accumulation time for a light-receiving element corresponding to a wavelength region equal to or less than the threshold is set at an upper limit of electric-charge accumulation time causing no saturation in any light-receiving element. Based on the ratio between the threshold and the peak spectral intensity in the specific wavelength region greater than the threshold, an electric-charge accumulation time for the light-receiving element corresponding to the specific wavelength region greater than the threshold is set.
|
