发明名称 METHOD FOR PATTERNING A PHOTOSENSITIVE LAYER
摘要 The method of patterning a photosensitive layer includes providing a substrate including a first layer formed thereon, treating the substrate including the first layer with cations, forming a first photosensitive layer over the first layer, patterning the first photosensitive layer to form a first pattern, treating the first pattern with cations, forming a second photosensitive layer over the treated first pattern, patterning the second photosensitive layer to form a second pattern, and processing the first layer using the first and second patterns as a mask.
申请公布号 US2009081591(A1) 申请公布日期 2009.03.26
申请号 US20070861064 申请日期 2007.09.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LU HSIAO-TZU;CHEN KEUI SHUN;WU TSIAO-CHEN;CHANG VENCENT;LIU GEORGE
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址