INSPECTION METHOD OF ORGANIC EL ELEMENT AND ORGANIC EL DISPLAY DEVICE, AND PRODUCTION SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide an inspection method for detecting a latent non-lighting site of an organic EL element and an organic EL display device. SOLUTION: The inspection method of an organic EL element comprises a first step of measuring a light emitting layer-derived emission spectrum obtained by emitting an exciting light to a luminous area of the organic EL element; and a second step of detecting a latent non-lighting area of the organic EL element from the emission spectrum. COPYRIGHT: (C)2009,JPO&INPIT