发明名称 CMP SLURRY FOR SILICON FILM POLISHING AND POLISHING METHOD
摘要 <p>Disclosed is a CMP slurry for silicon film polishing, which is composed of a polishing composition containing abrasive grains, an oxidizing agent, a cationic surfactant and water. This polishing composition is suitable for the CMP step of a silicon film of semiconductor devices, since it enables to obtain excellent flatness and remaining film thickness controllability, while improving the yield and reliability of the semiconductor devices. This polishing composition also enables to reduce the production cost.</p>
申请公布号 WO2009037903(A1) 申请公布日期 2009.03.26
申请号 WO2008JP60460 申请日期 2008.06.06
申请人 HITACHI CHEMICAL CO., LTD.;NARITA, TAKENORI 发明人 NARITA, TAKENORI
分类号 B24B37/00;H01L21/304 主分类号 B24B37/00
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