| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device capable of extracting image data containing the flaw of an inspection target from a large quantity of image data in a shorter time, and to provide an inspection method. SOLUTION: This inspection device has an imaging camera 30 for respectively imaging a plurality of the ranges shifted in a predetermined direction of the inspection target, an image processing part 40 for extracting a flaw signal showing the flaw of the inspection target in each of a plurality of the images captured the imaging camera 30 and a display part for displaying the processing result by the image processing part 40. COPYRIGHT: (C)2009,JPO&INPIT
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