发明名称 MEMORY INSPECTION SYSTEM, DISPLAY DEVICE FOR GAME MACHINE AND MEMORY INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a memory inspection system or the like capable of further shortening the inspection time of the memory connected to an image conversion part. SOLUTION: In the memory inspection system in which a display device 100 includes a scaler 140 for converting the size of an image, a CPU 110 connected to the scaler 140 via a communication path 180, a GPU 120 connected to the scaler 140 via a communication path 192, a VRAM 130 connected to the GPU 120 via a communication path 193, and a VRAM 150 connected to the scaler 140 via a communication path 194, the communication paths 192-194 are formed so as to be able to transfer the data at a higher speed than the communication path 180. The data for memory inspection is stored in the VRAM 130. The CPU 110 outputs a write control information to the GPU 120. The GPU 120 transfers the data for memory inspection to the scaler 140 from the write control information. The scaler 140 writes the data for memory inspection in the VRAM 150. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009061215(A) 申请公布日期 2009.03.26
申请号 JP20070233851 申请日期 2007.09.10
申请人 SEIKO EPSON CORP 发明人 TSUKAGOSHI SHINICHI
分类号 A63F7/02 主分类号 A63F7/02
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