发明名称 METHOD AND APPARATUS FOR MANAGING MANUFACTURING EQUIPMENT, METHOD FOR MANUFACTURING DEVICE THEREBY
摘要 Provided is a method for managing manufacturing apparatuses used in a managed production line including a plurality of manufacturing processes for manufacturing an electronic device, each of the apparatuses being used in each of the processes, the method including: acquiring a property of a reference device manufactured in a predetermined reference production line including the manufacturing processes to be performed; performing at least one of the manufacturing processes in the managed production line, performing the other manufacturing processes in the reference production line, and manufacturing a comparison device; measuring a property of the comparison device; comparing the measured properties between the reference and the comparison devices; and judging whether the manufacturing apparatus used in the at least one manufacturing process is defective or not, based on a property difference between the reference and the comparison devices.
申请公布号 US2009081819(A1) 申请公布日期 2009.03.26
申请号 US20080055310 申请日期 2008.03.25
申请人 ADVANTEST CORPORATION;NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY 发明人 OKAYASU TOSHIYUKI;SUGAWA SHIGETOSHI;TERAMOTO AKINOBU
分类号 H01L21/66;B08B5/00;B08B7/04;B08B13/00;C23C14/34;C23C16/00;C23F1/08;C25D5/00;C25D17/00;G03B27/52;G03F7/20;G05B19/418;H01L21/02 主分类号 H01L21/66
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