| 摘要 |
A chamber apparatus of a solid state disk test handler is provided to change a temperature condition in a chamber during an automatic SSD(Solid State Disk) test, thereby improving quality by electrically testing an SSD. A main supporting member(10) is installed in a plurality of cover members(11,12,13). The cover member comprises the same member as a door(11a) or an assistant cover(12a). The first heating unit is installed on an upper side of the main supporting member to heat an upper space. The second heating unit is installed on a lower side of the main supporting member to heat a lower space. A vertical conveying unit(40) vertically conveys a test tray(10a). The vertical conveying unit are respectively installed in one side and the other side of the main supporting member. |
