| 摘要 |
A probe pin and the method for manufacturing the same are provided to deliver the stress through the elastic beam part and elasticity tip part in the test operation process by forming the elasticity tip part on the lower part of the tip part. The probe pin is comprised of the lower probe part(100) and the upper probe part(200). The lower probe part and upper probe part are is bonded physically by the solder layer(300). The lower probe part is comprised of the post portion(110), and the elastic beam part(130) and elastic tip part(150). The post portion is connected to the elastic beam part. The post portion is connected to the upper probe part through the solder layer. The elastic beam part is physically connected to the post portion. The elastic tip part is formed at the end of the elastic beam part. The upper probe part is comprised of the beam part(210) and the tip part(230).
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