发明名称 CLEAING SOLUTION FOR IMMERSION PHOTOLITHOGRAPHY SYSTEM AND IMMERSION PHOTOLITHOGRAPHY PROCESS
摘要 <p>A cleaning solution for an immersion photolithography system is provided to increase production yield by preventing a wafer from being contaminated a next wafer in immersion photolithography process. An immersion photolithography system is exposed to the outside through a plurality of wafer immersion mediums. An exposure process is interrupted after a predetermined cycle. The immersion photolithography system cleaning the region contacted with the wafer immersion medium with a cleaning solution. The cleaning process removes a contaminant by flowing the cleaning solution for a predetermined time and also includes a rinsing the contact region.</p>
申请公布号 KR20090030491(A) 申请公布日期 2009.03.25
申请号 KR20070095841 申请日期 2007.09.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SE YEON;KO, YONG KYUN;LEE, SANG MI;LEE, YANG KOO;YI, HUN JUNG;LEE, KUN TACK
分类号 H01L21/027;H01L21/304 主分类号 H01L21/027
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