CLEAING SOLUTION FOR IMMERSION PHOTOLITHOGRAPHY SYSTEM AND IMMERSION PHOTOLITHOGRAPHY PROCESS
摘要
<p>A cleaning solution for an immersion photolithography system is provided to increase production yield by preventing a wafer from being contaminated a next wafer in immersion photolithography process. An immersion photolithography system is exposed to the outside through a plurality of wafer immersion mediums. An exposure process is interrupted after a predetermined cycle. The immersion photolithography system cleaning the region contacted with the wafer immersion medium with a cleaning solution. The cleaning process removes a contaminant by flowing the cleaning solution for a predetermined time and also includes a rinsing the contact region.</p>
申请公布号
KR20090030491(A)
申请公布日期
2009.03.25
申请号
KR20070095841
申请日期
2007.09.20
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, SE YEON;KO, YONG KYUN;LEE, SANG MI;LEE, YANG KOO;YI, HUN JUNG;LEE, KUN TACK