A test handler is provided to improve production yield by transferring a customer tray which is loaded to an unloading area. A loading stacker(110) is installed a part of the bottom layer to make a customer tray mounted up and down. A first loading picker(140) moves a semiconductor devices of the checking object positioned in the first rectification region(130a) to the socket off buffer(150) or the loading buffer(160). A second loading picker(170) is equipped in the loading area(182) neighborhood of the tester(180). The semiconductor is transferred to the test tray from the loading buffer.
